![]() | ![]() |
1994 | ||
---|---|---|
2 | EE | Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther: Microprocessor Testing: Which Technique is Best? (Panel). DAC 1994: 294 |
1985 | ||
1 | R. Chandramouli, Hector R. Sucar: Defect Analysis and Fault Modeling in MOS Technology. ITC 1985: 313-321 |
1 | Jacob A. Abraham | [2] |
2 | R. Chandramouli | [1] |
3 | Bulent I. Dervisoglu | [2] |
4 | Sandip Kundu | [2] |
5 | Marc E. Levitt | [2] |
6 | Janak H. Patel | [2] |
7 | Ron G. Walther | [2] |
8 | Manuel A. d'Abreu | [2] |