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| 1994 | ||
|---|---|---|
| 2 | EE | Jacob A. Abraham, Sandip Kundu, Janak H. Patel, Manuel A. d'Abreu, Bulent I. Dervisoglu, Marc E. Levitt, Hector R. Sucar, Ron G. Walther: Microprocessor Testing: Which Technique is Best? (Panel). DAC 1994: 294 |
| 1985 | ||
| 1 | R. Chandramouli, Hector R. Sucar: Defect Analysis and Fault Modeling in MOS Technology. ITC 1985: 313-321 | |
| 1 | Jacob A. Abraham | [2] |
| 2 | R. Chandramouli | [1] |
| 3 | Bulent I. Dervisoglu | [2] |
| 4 | Sandip Kundu | [2] |
| 5 | Marc E. Levitt | [2] |
| 6 | Janak H. Patel | [2] |
| 7 | Ron G. Walther | [2] |
| 8 | Manuel A. d'Abreu | [2] |