| 2006 |
|---|
| 5 | EE | Bart Keppens,
Markus P. J. Mergens,
Cong Son Trinh,
Christian C. Russ,
Benjamin Van Camp,
Koen G. Verhaege:
ESD protection solutions for high voltage technologies.
Microelectronics Reliability 46(5-6): 677-688 (2006) |
| 2005 |
|---|
| 4 | EE | Markus P. J. Mergens,
Geert Wybo,
Bart Keppens,
Benjamin Van Camp,
Frederic De Ranter,
Koen G. Verhaege,
John Armer,
Phillip Jozwiak,
Christian C. Russ:
ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies.
ISCAS (2) 2005: 1194-1197 |
| 2003 |
|---|
| 3 | EE | S. Trinh,
Markus P. J. Mergens,
Koen G. Verhaege,
Christian C. Russ,
John Armer,
Phillip Jozwiak,
Bart Keppens,
Russ Mohn,
G. Taylor,
Frederic De Ranter:
Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling.
Microelectronics Reliability 43(9-11): 1537-1543 (2003) |
| 2002 |
|---|
| 2 | EE | Bart Keppens,
V. De Heyn,
M. Natarajan Iyer,
Vesselin K. Vassilev,
Guido Groeseneken:
Significance of the failure criterion on transmission line pulse testing.
Microelectronics Reliability 42(6): 901-907 (2002) |
| 2001 |
|---|
| 1 | EE | K. Bock,
Bart Keppens,
V. De Heyn,
Guido Groeseneken,
L. Y. Ching,
A. Naem:
Influence of gate length on ESD-performance for deep submicron CMOS technology.
Microelectronics Reliability 41(3): 375-383 (2001) |
