| |
| 2001 | ||
|---|---|---|
| 1 | EE | K. Bock, Bart Keppens, V. De Heyn, Guido Groeseneken, L. Y. Ching, A. Naem: Influence of gate length on ESD-performance for deep submicron CMOS technology. Microelectronics Reliability 41(3): 375-383 (2001) |
| 1 | K. Bock | [1] |
| 2 | L. Y. Ching | [1] |
| 3 | Guido Groeseneken | [1] |
| 4 | V. De Heyn | [1] |
| 5 | Bart Keppens | [1] |