| 2006 |
|---|
| 6 | EE | Bart Keppens,
Markus P. J. Mergens,
Cong Son Trinh,
Christian C. Russ,
Benjamin Van Camp,
Koen G. Verhaege:
ESD protection solutions for high voltage technologies.
Microelectronics Reliability 46(5-6): 677-688 (2006) |
| 2005 |
|---|
| 5 | EE | Markus P. J. Mergens,
Geert Wybo,
Bart Keppens,
Benjamin Van Camp,
Frederic De Ranter,
Koen G. Verhaege,
John Armer,
Phillip Jozwiak,
Christian C. Russ:
ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies.
ISCAS (2) 2005: 1194-1197 |
| 2003 |
|---|
| 4 | EE | Markus P. J. Mergens,
Christian C. Russ,
Koen G. Verhaege,
John Armer,
Phillip Jozwiak,
Russ Mohn:
High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation.
Microelectronics Reliability 43(7): 993-1000 (2003) |
| 3 | EE | S. Trinh,
Markus P. J. Mergens,
Koen G. Verhaege,
Christian C. Russ,
John Armer,
Phillip Jozwiak,
Bart Keppens,
Russ Mohn,
G. Taylor,
Frederic De Ranter:
Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling.
Microelectronics Reliability 43(9-11): 1537-1543 (2003) |
| 2002 |
|---|
| 2 | EE | Koen G. Verhaege,
Markus P. J. Mergens,
Christian C. Russ,
John Armer,
Phillip Jozwiak:
Novel design of driver and ESD transistors with significantly reduced silicon area.
Microelectronics Reliability 42(1): 3-13 (2002) |
| 2001 |
|---|
| 1 | EE | Koen G. Verhaege,
Christian C. Russ:
Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies.
Microelectronics Reliability 41(11): 1739-1749 (2001) |
