Russ Mohn

2003
2	EE	Markus P. J. Mergens, Christian C. Russ, Koen G. Verhaege, John Armer, Phillip Jozwiak, Russ Mohn: High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation. Microelectronics Reliability 43(7): 993-1000 (2003)
1	EE	S. Trinh, Markus P. J. Mergens, Koen G. Verhaege, Christian C. Russ, John Armer, Phillip Jozwiak, Bart Keppens, Russ Mohn, G. Taylor, Frederic De Ranter: Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling. Microelectronics Reliability 43(9-11): 1537-1543 (2003)

Coauthor Index

1	John Armer	[1] [2]
2	Phillip Jozwiak	[1] [2]
3	Bart Keppens	[1]
4	Markus P. J. Mergens	[1] [2]
5	Frederic De Ranter	[1]
6	Christian C. Russ	[1] [2]
7	G. Taylor	[1]
8	S. Trinh	[1]
9	Koen G. Verhaege	[1] [2]