Benjamin Van Camp

2006
2	EE	Bart Keppens, Markus P. J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege: ESD protection solutions for high voltage technologies. Microelectronics Reliability 46(5-6): 677-688 (2006)
2005
1	EE	Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ: ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. ISCAS (2) 2005: 1194-1197

Coauthor Index

1	John Armer	[1]
2	Phillip Jozwiak	[1]
3	Bart Keppens	[1] [2]
4	Markus P. J. Mergens	[1] [2]
5	Frederic De Ranter	[1]
6	Christian C. Russ	[1] [2]
7	Cong Son Trinh	[2]
8	Koen G. Verhaege	[1] [2]
9	Geert Wybo	[1]