| 2003 |
|---|
| 3 | EE | Vesselin K. Vassilev,
S. Jenei,
Guido Groeseneken,
R. Venegas,
S. Thijs,
V. De Heyn,
M. Natarajan Iyer,
Michiel Steyaert,
H. E. Maes:
High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices.
Microelectronics Reliability 43(7): 1011-1020 (2003) |
| 2002 |
|---|
| 2 | EE | Bart Keppens,
V. De Heyn,
M. Natarajan Iyer,
Vesselin K. Vassilev,
Guido Groeseneken:
Significance of the failure criterion on transmission line pulse testing.
Microelectronics Reliability 42(6): 901-907 (2002) |
| 2001 |
|---|
| 1 | EE | K. Bock,
Bart Keppens,
V. De Heyn,
Guido Groeseneken,
L. Y. Ching,
A. Naem:
Influence of gate length on ESD-performance for deep submicron CMOS technology.
Microelectronics Reliability 41(3): 375-383 (2001) |
