| |
| 2006 | ||
|---|---|---|
| 1 | EE | Bart Keppens, Markus P. J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege: ESD protection solutions for high voltage technologies. Microelectronics Reliability 46(5-6): 677-688 (2006) |
| 1 | Benjamin Van Camp | [1] |
| 2 | Bart Keppens | [1] |
| 3 | Markus P. J. Mergens | [1] |
| 4 | Christian C. Russ | [1] |
| 5 | Koen G. Verhaege | [1] |