| 2006 |
|---|
| 3 | EE | S. Thijs,
M. Natarajan Iyer,
D. Linten,
Wutthinan Jeamsaksiri,
T. Daenen,
Robin Degraeve,
Andries Scholten,
Stefaan Decoutere,
Guido Groeseneken:
Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions.
Microelectronics Reliability 46(5-6): 702-712 (2006) |
| 2003 |
|---|
| 2 | EE | Vesselin K. Vassilev,
S. Jenei,
Guido Groeseneken,
R. Venegas,
S. Thijs,
V. De Heyn,
M. Natarajan Iyer,
Michiel Steyaert,
H. E. Maes:
High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices.
Microelectronics Reliability 43(7): 1011-1020 (2003) |
| 2002 |
|---|
| 1 | EE | Bart Keppens,
V. De Heyn,
M. Natarajan Iyer,
Vesselin K. Vassilev,
Guido Groeseneken:
Significance of the failure criterion on transmission line pulse testing.
Microelectronics Reliability 42(6): 901-907 (2002) |
