Mark Craig

2006
3	EE	Jie Yang, Ethan Cohen, Cyrus Tabery, Norma Rodriguez, Mark Craig: An up-stream design auto-fix flow for manufacturability enhancement. DAC 2006: 73-76
2002
2	EE	Mark Craig, Alvin Jee, Prashant Maniar: An Integrated Approach to Yield Loss Characterization. ITC 2002: 350-356
1	EE	Jim Bordelon, Ben Tranchina, Vipin Madangarli, Mark Craig: A Strategy for Mixed-Signal Yield Improvement. IEEE Design & Test of Computers 19(3): 14-23 (2002)

Coauthor Index

1	Jim Bordelon	[1]
2	Ethan Cohen	[3]
3	Alvin Jee	[2]
4	Vipin Madangarli	[1]
5	Prashant Maniar	[2]
6	Norma Rodriguez	[3]
7	Cyrus Tabery	[3]
8	Ben Tranchina	[1]
9	Jie Yang	[3]

Colors in the list of coauthors