Mitsutaka Niiro

2002
2	EE	Shigeki Tomishima, Hiroaki Tanizaki, Mitsutaka Niiro, Masanao Maruta, Hideto Hidaka, T. Tada, Kenji Gamo: A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. ITC 2002: 170-177
2000
1		Tomoya Kawagoe, Jun Ohtani, Mitsutaka Niiro, Tukasa Ooishi, Mitsuhiro Hamada, Hideto Hidaka: A built-in self-repair analyzer (CRESTA) for embedded DRAMs. ITC 2000: 567-574

Coauthor Index

1	Kenji Gamo	[2]
2	Mitsuhiro Hamada	[1]
3	Hideto Hidaka	[1] [2]
4	Tomoya Kawagoe	[1]
5	Masanao Maruta	[2]
6	Jun Ohtani	[1]
7	Tukasa Ooishi	[1]
8	T. Tada	[2]
9	Hiroaki Tanizaki	[2]
10	Shigeki Tomishima	[2]