2002 | ||
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1 | EE | Shigeki Tomishima, Hiroaki Tanizaki, Mitsutaka Niiro, Masanao Maruta, Hideto Hidaka, T. Tada, Kenji Gamo: A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. ITC 2002: 170-177 |
1 | Kenji Gamo | [1] |
2 | Hideto Hidaka | [1] |
3 | Mitsutaka Niiro | [1] |
4 | T. Tada | [1] |
5 | Hiroaki Tanizaki | [1] |
6 | Shigeki Tomishima | [1] |