| |
| 2005 | ||
|---|---|---|
| 1 | EE | B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin: Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectronics Reliability 45(9-11): 1717-1722 (2005) |
| 1 | X. Chauffleur | [1] |
| 2 | A. Deram | [1] |
| 3 | J. M. Dorkel | [1] |
| 4 | Ph. Dupuy | [1] |
| 5 | J. P. Fradin | [1] |
| 6 | B. Khong | [1] |
| 7 | M. Legros | [1] |
| 8 | C. Levade | [1] |
| 9 | P. Tounsi | [1] |