Ph. Dupuy

2005
1	EE	B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin: Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectronics Reliability 45(9-11): 1717-1722 (2005)

Coauthor Index

1	X. Chauffleur	[1]
2	A. Deram	[1]
3	J. M. Dorkel	[1]
4	J. P. Fradin	[1]
5	B. Khong	[1]
6	M. Legros	[1]
7	C. Levade	[1]
8	P. Tounsi	[1]
9	G. Vanderschaeve	[1]