2005 | ||
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1 | EE | B. Khong, P. Tounsi, Ph. Dupuy, X. Chauffleur, M. Legros, A. Deram, C. Levade, G. Vanderschaeve, J. M. Dorkel, J. P. Fradin: Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectronics Reliability 45(9-11): 1717-1722 (2005) |
1 | X. Chauffleur | [1] |
2 | A. Deram | [1] |
3 | J. M. Dorkel | [1] |
4 | Ph. Dupuy | [1] |
5 | J. P. Fradin | [1] |
6 | B. Khong | [1] |
7 | M. Legros | [1] |
8 | P. Tounsi | [1] |
9 | G. Vanderschaeve | [1] |