2004 |
22 | EE | Mansour H. Assaf,
Rami S. Abielmona,
Payam Abolghasem,
Sunil R. Das,
Emil M. Petriu,
Voicu Groza,
Mehmet Sahinoglu:
Implementation of Embedded Cores-Based Digital Devices in JBits Java Simulation Environment.
CIT 2004: 315-325 |
21 | EE | Mansour H. Assaf,
Sunil R. Das,
Emil M. Petriu,
Mehmet Sahinoglu:
Enhancing Testability in Architectural Design for the New Generation of Core-Based Embedded Systems.
HASE 2004: 312-313 |
20 | EE | Sunil R. Das,
Chuan Jin,
Liwu Jin,
Mansour H. Assaf,
Emil M. Petriu,
Mehmet Sahinoglu:
Altera Max Plus II Development Environment in Fault Simulation and Test Implementation of Embedded Cores-Based Sequential Circuits.
IWDC 2004: 353-360 |
2003 |
19 | | Mansour H. Assaf,
Rami S. Abielmona,
Payam Abolghasem,
Sunil R. Das,
Emil M. Petriu,
Voicu Groza:
JBits Implementation and Design Verification in Space Compressor Design of Digital Circuits.
Modelling, Identification and Control 2003: 415-420 |
2002 |
18 | EE | Sunil R. Das,
Mansour H. Assaf,
Emil M. Petriu,
Sujoy Mukherjee:
Design of Aliasing Free Space Compressor in BIST with Maximal Compaction Ratio Using Concepts of Strong and Weak Compatibilities of Response Data Outputs and Generalized Sequence Mergeability.
IWDC 2002: 234-245 |
2001 |
17 | EE | Der-Cheng Huang,
Wen-Ben Jone,
Sunil R. Das:
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers.
VLSI Design 2001: 379-384 |
16 | EE | Der-Cheng Huang,
Wen-Ben Jone,
Sunil R. Das:
A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers.
VLSI Design 2001: 397-402 |
1998 |
15 | | Emil M. Petriu,
Sunil R. Das,
N. Trif,
S. K. Yeung:
Pseudorandom encoding for structured light applications.
Computers and Their Applications 1998: 287-290 |
14 | EE | Wen-Ben Jone,
Sunil R. Das:
A Stochastic Method for Defect Level Analysis of Pseudorandom Testing.
VLSI Design 1998: 382- |
1997 |
13 | EE | Wen-Ben Jone,
Yun-Pan Ho,
Sunil R. Das:
Delay Fault Coverage Enhancement Using Multiple Test Observation Times.
VLSI Design 1997: 106-110 |
12 | EE | Wen-Ben Jone,
Yun-Pan Ho,
Sunil R. Das:
Delay Fault Coverage Enhancement Using Variable Observation Times.
J. Electronic Testing 11(2): 131-146 (1997) |
1996 |
11 | EE | Sunil R. Das,
N. Goel,
Wen-Ben Jone,
A. R. Nayak:
Syndrome signature in output compaction for VLSI BIST.
VLSI Design 1996: 337-338 |
1995 |
10 | EE | Sunil R. Das,
H. T. Ho,
Wen-Ben Jone,
A. R. Nayak:
An improved output compaction technique for built-in self-test in VLSI circuits.
VLSI Design 1995: 403-407 |
1994 |
9 | | A. R. Nayak,
Wen-Ben Jone,
Sunil R. Das:
Designing General-Purpose Fault-Tolerant Distributed Systems - A Layered Approach.
ICPADS 1994: 360-365 |
8 | | Sunil R. Das,
Wen-Ben Jone,
Amiya Nayak,
Ian Choi:
On Probabilistic Testing of Large-Scale Sequential Circuits Using Circuit Decomposition.
VLSI Design 1994: 311-314 |
1993 |
7 | | Wen-Ben Jone,
Sunil R. Das:
CACOP - A Random Pattern Testability Analyzer.
VLSI Design 1993: 61-64 |
1990 |
6 | EE | Sunil R. Das,
Amiya Nayak:
A survey on bit dimension optimization strategies of microprograms.
MICRO 1990: 281-291 |
5 | EE | Wen-Ben Jone,
Sunil R. Das:
Multiple-output parity bit signature for exhaustive testing.
J. Electronic Testing 1(2): 175-178 (1990) |
1987 |
4 | EE | Sunil R. Das,
Ping Chao,
Zen Chen,
Yow Lung Dai,
Mrinal K. Das:
Transition submatrices in regular homing experiments and identification of sequential machines of known class using direct-sum transition matrices.
Computers & OR 14(5): 415-433 (1987) |
1986 |
3 | EE | Sunil R. Das:
On random testing of sequential digital logic with a high confidence measure (abstract).
ACM Conference on Computer Science 1986: 498 |
1979 |
2 | EE | Sunil R. Das,
C. L. Sheng,
Zen Chen,
W. J. Hsu:
Transition matrices in the measurement and control of synchronous sequential machines.
Inf. Sci. 18(1): 47-65 (1979) |
1978 |
1 | EE | Sunil R. Das,
C. L. Sheng:
Strong connectivity in symmetric graphs and generation of maximal minimally strongly connected subgraphs.
Inf. Sci. 14(3): 181-187 (1978) |