Ian Choi

1994
1		Sunil R. Das, Wen-Ben Jone, Amiya Nayak, Ian Choi: On Probabilistic Testing of Large-Scale Sequential Circuits Using Circuit Decomposition. VLSI Design 1994: 311-314

Coauthor Index

1	Sunil R. Das	[1]
2	Wen-Ben Jone	[1]
3	Amiya Nayak	[1]