| |
| 1997 | ||
|---|---|---|
| 2 | EE | Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das: Delay Fault Coverage Enhancement Using Multiple Test Observation Times. VLSI Design 1997: 106-110 |
| 1 | EE | Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das: Delay Fault Coverage Enhancement Using Variable Observation Times. J. Electronic Testing 11(2): 131-146 (1997) |
| 1 | Sunil R. Das | [1] [2] |
| 2 | Wen-Ben Jone | [1] [2] |