| 2003 |
|---|
| 10 | EE | G. Gautier,
S. Crand,
Olivier Bonnaud:
Dynamic electrical characterization of CMOS-like Thin Film Transistor circuits.
MSE 2003: 14-15 |
| 9 | EE | Hamid Toutah,
Boubekeur Tala-Ighil,
Jean-François Llibre,
B. Boudart,
Taieb Mohammed-Brahim,
Olivier Bonnaud:
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.
Microelectronics Reliability 43(9-11): 1531-1535 (2003) |
| 8 | EE | Yannick Rey-Tauriac,
O. de Sagazan,
M. Taurin,
Olivier Bonnaud:
Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology.
Microelectronics Reliability 43(9-11): 1865-1869 (2003) |
| 2002 |
|---|
| 7 | EE | E. Carvou,
F. Le Bihan,
A. C. Salaün,
R. Rogel,
Olivier Bonnaud,
Yannick Rey-Tauriac,
Xavier Gagnard,
L. Roland:
Reliability improvement of high value doped polysilicon-based resistors.
Microelectronics Reliability 42(9-11): 1369-1372 (2002) |
| 2001 |
|---|
| 6 | EE | Olivier Bonnaud,
P. Münster,
H. Lhermite,
C. Diaconescu:
Interactive Microelectronics Technology Course Available on Website.
MSE 2001: 14-15 |
| 5 | | Hamid Toutah,
Jean-François Llibre,
Boubekeur Tala-Ighil,
Taieb Mohammed-Brahim,
Youri Helen,
G. Gautier,
Olivier Bonnaud:
Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating.
Microelectronics Reliability 41(9-10): 1325-1329 (2001) |
| 4 | | Yannick Rey-Tauriac,
M. Taurin,
Olivier Bonnaud:
Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS.
Microelectronics Reliability 41(9-10): 1331-1334 (2001) |
| 3 | | Xavier Gagnard,
Yannick Rey-Tauriac,
Olivier Bonnaud:
Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology.
Microelectronics Reliability 41(9-10): 1335-1340 (2001) |
| 1999 |
|---|
| 2 | EE | Sandrine Lucas,
N. Outaleb,
Olivier Bonnaud,
J. Pine:
Realization and SEM Observation of Polysilicon and Aluminium Cantilever Using Surface Micromachining Technology.
MSE 1999: 28-29 |
| 1 | EE | D. Guillet,
K. Mourgues,
R. Rogel,
H. Lhermite,
Olivier Bonnaud:
Student Realization in Cleanroom of Silicon-Germanium Thin Film Transistors.
MSE 1999: 69-70 |
