| 2006 |
|---|
| 3 | EE | Y. Guhel,
B. Boudart,
E. Delos,
M. Germain,
Z. Bougrioua:
Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N.
Microelectronics Reliability 46(5-6): 786-793 (2006) |
| 2005 |
|---|
| 2 | EE | C. O. Maïga,
Hamid Toutah,
Boubekeur Tala-Ighil,
B. Boudart:
Trench insulated gate bipolar transistors submitted to high temperature bias stress.
Microelectronics Reliability 45(9-11): 1728-1731 (2005) |
| 2003 |
|---|
| 1 | EE | Hamid Toutah,
Boubekeur Tala-Ighil,
Jean-François Llibre,
B. Boudart,
Taieb Mohammed-Brahim,
Olivier Bonnaud:
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.
Microelectronics Reliability 43(9-11): 1531-1535 (2003) |
