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B. Boudart

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2006
3EEY. Guhel, B. Boudart, E. Delos, M. Germain, Z. Bougrioua: Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N. Microelectronics Reliability 46(5-6): 786-793 (2006)
2005
2EEC. O. Maïga, Hamid Toutah, Boubekeur Tala-Ighil, B. Boudart: Trench insulated gate bipolar transistors submitted to high temperature bias stress. Microelectronics Reliability 45(9-11): 1728-1731 (2005)
2003
1EEHamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, B. Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud: Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectronics Reliability 43(9-11): 1531-1535 (2003)

Coauthor Index

1Olivier Bonnaud [1]
2Z. Bougrioua [3]
3E. Delos [3]
4M. Germain [3]
5Y. Guhel [3]
6Jean-François Llibre [1]
7C. O. Maïga [2]
8Taieb Mohammed-Brahim [1]
9Boubekeur Tala-Ighil [1] [2]
10Hamid Toutah [1] [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)