| 2005 |
|---|
| 3 | EE | C. O. Maïga,
Hamid Toutah,
Boubekeur Tala-Ighil,
B. Boudart:
Trench insulated gate bipolar transistors submitted to high temperature bias stress.
Microelectronics Reliability 45(9-11): 1728-1731 (2005) |
| 2003 |
|---|
| 2 | EE | Hamid Toutah,
Boubekeur Tala-Ighil,
Jean-François Llibre,
B. Boudart,
Taieb Mohammed-Brahim,
Olivier Bonnaud:
Degradation in polysilicon thin film transistors related to the quality of the polysilicon material.
Microelectronics Reliability 43(9-11): 1531-1535 (2003) |
| 2001 |
|---|
| 1 | | Hamid Toutah,
Jean-François Llibre,
Boubekeur Tala-Ighil,
Taieb Mohammed-Brahim,
Youri Helen,
G. Gautier,
Olivier Bonnaud:
Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating.
Microelectronics Reliability 41(9-10): 1325-1329 (2001) |
