| |
| 2002 | ||
|---|---|---|
| 2 | EE | E. Carvou, F. Le Bihan, A. C. Salaün, R. Rogel, Olivier Bonnaud, Yannick Rey-Tauriac, Xavier Gagnard, L. Roland: Reliability improvement of high value doped polysilicon-based resistors. Microelectronics Reliability 42(9-11): 1369-1372 (2002) |
| 1999 | ||
| 1 | EE | D. Guillet, K. Mourgues, R. Rogel, H. Lhermite, Olivier Bonnaud: Student Realization in Cleanroom of Silicon-Germanium Thin Film Transistors. MSE 1999: 69-70 |
| 1 | F. Le Bihan | [2] |
| 2 | Olivier Bonnaud | [1] [2] |
| 3 | E. Carvou | [2] |
| 4 | Xavier Gagnard | [2] |
| 5 | D. Guillet | [1] |
| 6 | H. Lhermite | [1] |
| 7 | K. Mourgues | [1] |
| 8 | Yannick Rey-Tauriac | [2] |
| 9 | L. Roland | [2] |
| 10 | A. C. Salaün | [2] |