| |
| 2002 | ||
|---|---|---|
| 2 | EE | E. Carvou, F. Le Bihan, A. C. Salaün, R. Rogel, Olivier Bonnaud, Yannick Rey-Tauriac, Xavier Gagnard, L. Roland: Reliability improvement of high value doped polysilicon-based resistors. Microelectronics Reliability 42(9-11): 1369-1372 (2002) |
| 2001 | ||
| 1 | Xavier Gagnard, Yannick Rey-Tauriac, Olivier Bonnaud: Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology. Microelectronics Reliability 41(9-10): 1335-1340 (2001) | |
| 1 | F. Le Bihan | [2] |
| 2 | Olivier Bonnaud | [1] [2] |
| 3 | E. Carvou | [2] |
| 4 | Yannick Rey-Tauriac | [1] [2] |
| 5 | R. Rogel | [2] |
| 6 | L. Roland | [2] |
| 7 | A. C. Salaün | [2] |