| |
| 2003 | ||
|---|---|---|
| 2 | EE | Hamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, B. Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud: Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectronics Reliability 43(9-11): 1531-1535 (2003) |
| 2001 | ||
| 1 | Hamid Toutah, Jean-François Llibre, Boubekeur Tala-Ighil, Taieb Mohammed-Brahim, Youri Helen, G. Gautier, Olivier Bonnaud: Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating. Microelectronics Reliability 41(9-10): 1325-1329 (2001) | |
| 1 | Olivier Bonnaud | [1] [2] |
| 2 | B. Boudart | [2] |
| 3 | G. Gautier | [1] |
| 4 | Youri Helen | [1] |
| 5 | Jean-François Llibre | [1] [2] |
| 6 | Boubekeur Tala-Ighil | [1] [2] |
| 7 | Hamid Toutah | [1] [2] |