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2003 | ||
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2 | EE | Yannick Rey-Tauriac, O. de Sagazan, M. Taurin, Olivier Bonnaud: Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. Microelectronics Reliability 43(9-11): 1865-1869 (2003) |
2001 | ||
1 | Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud: Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS. Microelectronics Reliability 41(9-10): 1331-1334 (2001) |
1 | Olivier Bonnaud | [1] [2] |
2 | Yannick Rey-Tauriac | [1] [2] |
3 | O. de Sagazan | [2] |