| |
| 2003 | ||
|---|---|---|
| 2 | EE | Yannick Rey-Tauriac, O. de Sagazan, M. Taurin, Olivier Bonnaud: Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology. Microelectronics Reliability 43(9-11): 1865-1869 (2003) |
| 2001 | ||
| 1 | Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud: Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS. Microelectronics Reliability 41(9-10): 1331-1334 (2001) | |
| 1 | Olivier Bonnaud | [1] [2] |
| 2 | Yannick Rey-Tauriac | [1] [2] |
| 3 | O. de Sagazan | [2] |