| 2005 |
|---|
| 5 | EE | Yannick Rey-Tauriac,
J. Badoc,
B. Reynard,
R. A. Bianchi,
D. Lachenal,
A. Bravaix:
Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology.
Microelectronics Reliability 45(9-11): 1349-1354 (2005) |
| 2003 |
|---|
| 4 | EE | Yannick Rey-Tauriac,
O. de Sagazan,
M. Taurin,
Olivier Bonnaud:
Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology.
Microelectronics Reliability 43(9-11): 1865-1869 (2003) |
| 2002 |
|---|
| 3 | EE | E. Carvou,
F. Le Bihan,
A. C. Salaün,
R. Rogel,
Olivier Bonnaud,
Yannick Rey-Tauriac,
Xavier Gagnard,
L. Roland:
Reliability improvement of high value doped polysilicon-based resistors.
Microelectronics Reliability 42(9-11): 1369-1372 (2002) |
| 2001 |
|---|
| 2 | | Yannick Rey-Tauriac,
M. Taurin,
Olivier Bonnaud:
Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS.
Microelectronics Reliability 41(9-10): 1331-1334 (2001) |
| 1 | | Xavier Gagnard,
Yannick Rey-Tauriac,
Olivier Bonnaud:
Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology.
Microelectronics Reliability 41(9-10): 1335-1340 (2001) |
