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Hamid Toutah

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2005
3EEC. O. Maïga, Hamid Toutah, Boubekeur Tala-Ighil, B. Boudart: Trench insulated gate bipolar transistors submitted to high temperature bias stress. Microelectronics Reliability 45(9-11): 1728-1731 (2005)
2003
2EEHamid Toutah, Boubekeur Tala-Ighil, Jean-François Llibre, B. Boudart, Taieb Mohammed-Brahim, Olivier Bonnaud: Degradation in polysilicon thin film transistors related to the quality of the polysilicon material. Microelectronics Reliability 43(9-11): 1531-1535 (2003)
2001
1 Hamid Toutah, Jean-François Llibre, Boubekeur Tala-Ighil, Taieb Mohammed-Brahim, Youri Helen, G. Gautier, Olivier Bonnaud: Improved Stability of Large Area Excimer Laser Crstallised Polysilicon Thin Film Transistors under DC and AC Operating. Microelectronics Reliability 41(9-10): 1325-1329 (2001)

Coauthor Index

1Olivier Bonnaud [1] [2]
2B. Boudart [2] [3]
3G. Gautier [1]
4Youri Helen [1]
5Jean-François Llibre [1] [2]
6C. O. Maïga [3]
7Taieb Mohammed-Brahim [1] [2]
8Boubekeur Tala-Ighil [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)