Volume 55,
Number 1,
March 2006
- Wenbiao Zhao, Rong Pan, A. Aron, A. Mettas:
Some properties of confidence bounds on reliability estimation for parts under varying stresses.
7-17
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- P. Hokstad, A. Maria, P. Tomis:
Estimation of common cause factors from systems with different numbers of channels.
18-25
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- Jose Emmanuel Ramirez-Marquez, Wei Jiang:
On improved confidence bounds for system reliability.
26-36
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- Chunghun Ha, Way Kuo:
Multi-path heuristic for redundancy allocation: the tree heuristic.
37-43
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- J. F. Shortle, M. B. Mendel:
A generalized framework for probabilistic design with application to rotors.
44-52
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- Chi-Hyuck Jun, S. Balamurali, Sang-Ho Lee:
Variables sampling plans for Weibull distributed lifetimes under sudden death testing.
53-58
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- Chen-Mao Liao, Sheng-Tsaing Tseng:
Optimal design for step-stress accelerated degradation tests.
59-66
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- Chengjie Xiong, Kejun Zhu, Ming Ji:
Analysis of a simple step-stress life test with a random stress-change time.
67-74
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- P. Sadegh, A. Thompson, Xiaodong Luo, Young Park, T. Sienel:
A methodology for predicting service life and design of reliability experiments.
75-85
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- H. Boudali, Joanne Bechta Dugan:
A continuous-time Bayesian network reliability modeling, and analysis framework.
86-97
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- H. Yamamoto, Ming J. Zuo, T. Akiba, Zhigang Tian:
Recursive formulas for the reliability of multi-state consecutive-k-out-of-n: G systems.
98-104
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- Chin Ching Chiu, Chung-Hsien Hsu, Yi-Shiung Yeh:
A genetic algorithm for reliability-oriented task assignment with k/spl tilde/ duplications in distributed systems.
105-117
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- Guan Jun Wang, Yuan Lin Zhang:
Optimal periodic preventive repair and replacement policy assuming geometric process repair.
118-122
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- Yong Chen, Jionghua Jin:
Quality-oriented-maintenance for multiple interactive tooling components in discrete manufacturing processes.
123-134
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- T. T. John, P. Chen:
Lognormal selection with applications to lifetime data.
135-148
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- V. R. Joseph, I-Tang Yu:
Reliability improvement experiments with degradation data.
149-157
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Volume 55,
Number 2,
2006
- Yue Song, Hai-lin Feng, San-yang Liu:
Reliability models of a bridge system structure under incomplete information.
162-168
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- Jianfang Zhang:
The calculating formulae, and experimental methods in error propagation analysis.
169-181
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- Zhihua Zheng, Lirong Cui, A. G. Hawkes:
A study on a single-unit Markov repairable system with repair time omission.
182-188
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- Ji Hwan Cha:
An extended model for optimal burn-in procedures.
189-198
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- S. Satitsatian, K. C. Kapur:
An algorithm for lower reliability bounds of multistate two-terminal networks.
199-206
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- Juan A. Carrasco:
Failure Transition Distance-Based Importance Sampling Schemes for theSimulation of Repairable Fault-Tolerant Computer Systems.
207-236
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- A. M. Mathai, S. B. Provost:
On q-logistic and related models.
237-244
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- Mark Bebbington, Chin-Diew Lai, Ricardas Zitikis:
Useful periods for lifetime distributions with bathtub shaped hazard rate functions.
245-251
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- Masahiro Hayashi, Takeo Abe, I. Nakajima:
Transformation from availability expression to failure frequency expression.
252-261
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- Debasis Kundu, A. M. Sarhan:
Analysis of incomplete data in presence of competing risks among several groups.
262-269
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- Debasis Kundu, R. D. Gupta:
Estimation of P[Y<X] for Weibull distributions.
270-280
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- Swapna S. Gokhale, Michael R. Lyu, Kishor S. Trivedi:
Incorporating fault debugging activities into software reliability models: a simulation approach.
281-292
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- Shyue-Kung Lu, Chih-Hsien Hsu:
Fault tolerance techniques for high capacity RAM.
293-306
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- K. O. Kim:
Relating integrated circuit yield and time-dependent reliability for various defect density distributions.
307-313
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- M. Asadi, I. Bayramoglu:
The mean residual life function of a k-out-of-n structure at the system level.
314-318
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- Ming J. Zuo, Zhigang Tian:
Performance evaluation of generalized multi-state k-out-of-n systems.
319-327
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- Shwu-Tzy Jiang, T. L. Landers, T. R. Rhoads:
Assessment of repairable-system reliability using proportional intensity models: a review.
328-336
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- Yuan-Shun Dai, Gregory Levitin:
Reliability and performance of tree-structured grid services.
337-349
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- Zhihua Tang, Joanne Bechta Dugan:
BDD-based reliability analysis of phased-mission systems with multimode failures.
350-360
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- Xiang Zhang, E. Gockenbach:
Assessment of the actual condition of the electrical components in medium-voltage networks.
361-368
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- Hung-Yau Lin, Fu-Min Yeh, Sy-Ysen. Kuo:
An efficient algorithm for spare allocation problems.
369-378
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- C. Park, W. J. Padgett:
Stochastic degradation models with several accelerating variables.
379-390
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- M. Walter, Winfrid G. Schneeweiss:
Review of "The Modeling World of Reliability/Safety Engineering".
391
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- Winfrid G. Schneeweiss:
"Review of Petri Net Picture Book" and "Petri Nets for Reliability Modeling".
391-392
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Volume 55,
Number 3,
September 2006
- M. Falk, L. Heins, A. Wensauer:
Safety Assessment of Fuel Rods via Generalized Bernoulli Chains.
393-396
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- L. Cauffriez, V. Benard, D. Renaux:
A New Formalism for Designing and Specifying RAMS Parameters for Complex Distributed Control Systems: The Safe-SADT Formalism.
397-410
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- Michael Grottke, Lei Li, Kalyanaraman Vaidyanathan, Kishor S. Trivedi:
Analysis of Software Aging in a Web Server.
411-420
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- Ling Yuan, Jin Song Dong, Jing Sun, Hamid Abdul Basit:
Generic Fault Tolerant Software Architecture Reasoning and Customization.
421-435
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- C.-Y. Huang, C.-T. Lin:
Software Reliability Analysis by Considering Fault Dependency and Debugging Time Lag.
436-450
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- Dimiter R. Avresky, S. J. Geoghegan, Y. Varoglu:
Evaluation of Software-Implemented Fault-Tolerance (SIFT) Approach in Gracefully Degradable Multi-Computer Systems.
451-457
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- X. Teng, H. Pham:
A New Methodology for Predicting Software Reliability in the Random Field Environments.
458-468
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- Suprasad V. Amari:
Bounds on MTBF of Systems Subjected to Periodic Maintenance.
469-474
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- William J. Owen:
A New Three-Parameter Extension to the Birnbaum-Saunders Distribution.
475-479
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- B. Rai, B. Singh:
Customer-Rush Near Warranty Expiration Limit, and Nonparametric Hazard Rate Estimation From Known Mileage Accumulation Rates.
480-489
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- Félix Belzunce, Eva-Maria Ortega, Jose M. Ruiz:
Comparison of Expected Failure Times for Several Replacement Policies.
490-495
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- T. Li, B. Wang:
On Optimal p-Cycle-Based Protection in WDM Optical Networks With Sparse-Partial Wavelength Conversion.
496-506
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- Gregory Levitin, Yuan-Shun Dai, H. Ben-Haim:
Reliability and Performance of Star Topology Grid Service With Precedence Constraints on Subtask Execution.
507-515
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- A. Haque, P.-H. Ho:
A Study on the Design of Survivable Optical Virtual Private Networks (O-VPN).
516-524
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- N. Wang, J.-C. Lu, P. Kvam:
Reliability Modeling in Spatially Distributed Logistics Systems.
525-534
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- X. Li, P. Zhao:
Some Aging Properties of the Residual Life of$k$-out-of-$n$Systems.
535-541
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- J.-M. Bai, Z.-H. Li, X.-B. Kong:
Generalized Shock Models Based on a Cluster Point Process.
542-550
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- David W. Coit, Abdullah Konak:
Multiple Weighted Objectives Heuristic for the Redundancy Allocation Problem.
551-558
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- S. Chakraborti, S. W. Human:
Parameter Estimation and Performance of the$p$-Chart for Attributes Data.
559-566
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Volume 55,
Number 4,
December 2006
Copyright © Sun May 17 00:30:37 2009
by Michael Ley (ley@uni-trier.de)
