| 2009 |
|---|
| 23 | EE | Kyungmee O. Kim,
Way Kuo:
Optimal burn-in for maximizing reliability of repairable non-series systems.
European Journal of Operational Research 193(1): 140-151 (2009) |
| 2008 |
|---|
| 22 | EE | Tao Yuan,
Way Kuo:
Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference.
European Journal of Operational Research 190(1): 228-240 (2008) |
| 21 | EE | Xiaoyan Zhu,
Way Kuo:
Comments on "A Hierarchy of Importance Indices".
IEEE Transactions on Reliability 57(3): 529-531 (2008) |
| 2007 |
|---|
| 20 | EE | Way Kuo,
Rui Wan:
Recent Advances in Optimal Reliability Allocation.
Computational Intelligence in Reliability Engineering 2007: 1-36 |
| 19 | EE | Jung Yoon Hwang,
Way Kuo:
Model-based clustering for integrated circuit yield enhancement.
European Journal of Operational Research 178(1): 143-153 (2007) |
| 18 | EE | Way Kuo:
Corrections to "Challenges Related to Reliability in Nano Electronics".
IEEE Transactions on Reliability 56(1): 169 (2007) |
| 17 | EE | Way Kuo:
Editorial: How Reliable is Teaching Evaluation? The Relationship of Class Size to Teaching Evaluation Scores.
IEEE Transactions on Reliability 56(2): 178-181 (2007) |
| 16 | EE | Way Kuo,
Jason W. Rupe:
R-Impact: Reliability-Based Citation Impact Factor.
IEEE Transactions on Reliability 56(3): 366-367 (2007) |
| 15 | EE | Suk Joo Bae,
Seong-Joon Kim,
Way Kuo,
Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
IEEE Transactions on Reliability 56(3): 392-400 (2007) |
| 14 | EE | Xian Zhao,
Lirong Cui,
Way Kuo:
Reliability for Sparsely Connected Consecutive-k Systems.
IEEE Transactions on Reliability 56(3): 516-524 (2007) |
| 13 | EE | Way Kuo:
Compatibility and Simplicity: The Fundamentals of Reliability.
IEEE Transactions on Reliability 56(4): 585-586 (2007) |
| 12 | EE | Way Kuo,
Rui Wan:
Recent Advances in Optimal Reliability Allocation.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 37(2): 143-156 (2007) |
| 2006 |
|---|
| 11 | EE | Chunghun Ha,
Way Kuo:
Reliability redundancy allocation: An improved realization for nonconvex nonlinear programming problems.
European Journal of Operational Research 171(1): 24-38 (2006) |
| 10 | EE | Chunghun Ha,
Way Kuo:
Multi-path heuristic for redundancy allocation: the tree heuristic.
IEEE Transactions on Reliability 55(1): 37-43 (2006) |
| 2005 |
|---|
| 9 | EE | Chunghun Ha,
Way Kuo:
Multi-Path Approach for Reliability-Redundancy Allocation Using a Scaling Method.
J. Heuristics 11(3): 201-217 (2005) |
| 2004 |
|---|
| 8 | EE | Lirong Cui,
Way Kuo,
H. T. Loh,
M. Xie:
Optimal allocation of minimal & perfect repairs under resource constraints.
IEEE Transactions on Reliability 53(2): 193-199 (2004) |
| 7 | EE | Kyungmee O. Kim,
Way Kuo,
Wen Luo:
A relation model of gate oxide yield and reliability.
Microelectronics Reliability 44(3): 425-434 (2004) |
| 2002 |
|---|
| 6 | | Fen-Hui Lin,
Way Kuo:
Reliability Importance and Invariant Optimal Allocation.
J. Heuristics 8(2): 155-171 (2002) |
| 1999 |
|---|
| 5 | EE | Fen-Hui Lin,
Way Kuo,
Frank Hwang:
Structure importance of consecutive-k-out-of-n systems.
Oper. Res. Lett. 25(2): 101-107 (1999) |
| 1998 |
|---|
| 4 | | Jason W. Rupe,
Way Kuo:
Performability of systems based on renewal process models.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 28(5): 691-698 (1998) |
| 1996 |
|---|
| 3 | | Dick B. Simmons,
Newton C. Ellis,
Way Kuo:
Software Process Agents.
SEKE 1996: 323-329 |
| 1990 |
|---|
| 2 | EE | John P. Mullen,
Jason W. Rupe,
Srinagesh Gavirneni,
Way Kuo:
The Command and Control Communications and Information Network Anlysis Tool (C3INAT).
Winter Simulation Conference 1990: 888-894 |
| 1 | | Dong-Hae Chi,
Way Kuo:
Optimal Design for Software Reliability and Development Cost.
IEEE Journal on Selected Areas in Communications 8(2): 276-282 (1990) |
