2006 | ||
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2 | EE | B. Rai, B. Singh: Customer-Rush Near Warranty Expiration Limit, and Nonparametric Hazard Rate Estimation From Known Mileage Accumulation Rates. IEEE Transactions on Reliability 55(3): 480-489 (2006) |
2005 | ||
1 | EE | B. Rai, N. Singh: Forecasting warranty performance in the presence of the 'maturing data' phenomenon. Int. J. Systems Science 36(7): 381-394 (2005) |
1 | B. Singh | [2] |
2 | N. Singh | [1] |