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B. Rai

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2006
2EEB. Rai, B. Singh: Customer-Rush Near Warranty Expiration Limit, and Nonparametric Hazard Rate Estimation From Known Mileage Accumulation Rates. IEEE Transactions on Reliability 55(3): 480-489 (2006)
2005
1EEB. Rai, N. Singh: Forecasting warranty performance in the presence of the 'maturing data' phenomenon. Int. J. Systems Science 36(7): 381-394 (2005)

Coauthor Index

1B. Singh [2]
2N. Singh [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)