| |
| 2006 | ||
|---|---|---|
| 5 | EE | Shyue-Kung Lu, Yu-Chen Tsai, Chih-Hsien Hsu, Kuo-Hua Wang, Cheng-Wen Wu: Efficient built-in redundancy analysis for embedded memories with 2-D redundancy. IEEE Trans. VLSI Syst. 14(1): 34-42 (2006) |
| 4 | EE | Shyue-Kung Lu, Chih-Hsien Hsu: Fault tolerance techniques for high capacity RAM. IEEE Transactions on Reliability 55(2): 293-306 (2006) |
| 2002 | ||
| 3 | EE | Chih-Hsien Hsu, Shyue-Kung Lu: Fault-tolerance design of memory systems based on DBL structures. APCCAS (1) 2002: 221-224 |
| 2001 | ||
| 2 | EE | Shyue-Kung Lu, Chih-Hsien Hsu: Built-In self-repair for divided word line memory. ISCAS (4) 2001: 13-16 |
| 1 | EE | Chih-Hsien Hsu, Shyue-Kung Lu, Sy-Yen Kuo: Novel Fault-Tolerant Techniques for High Capacity RAMs. PRDC 2001: 11-18 |
| 1 | Sy-Yen Kuo | [1] |
| 2 | Shyue-Kung Lu | [1] [2] [3] [4] [5] |
| 3 | Yu-Chen Tsai | [5] |
| 4 | Kuo-Hua Wang | [5] |
| 5 | Cheng-Wen Wu | [5] |