| |
| 2006 | ||
|---|---|---|
| 2 | EE | D. Han, N. Balakrishnan, A. Sen, E. Gouno: Corrections on "Optimal Step-Stress Test Under Progressive Type-I Censoring". IEEE Transactions on Reliability 55(4): 613-614 (2006) |
| 2004 | ||
| 1 | EE | E. Gouno, A. Sen, N. Balakrishnan: Optimal step-stress test under progressive type-I censoring. IEEE Transactions on Reliability 53(3): 388-393 (2004) |
| 1 | N. Balakrishnan | [1] [2] |
| 2 | D. Han | [2] |
| 3 | A. Sen | [1] [2] |