K. O. Kim

List of publications from the DBLP Bibliography Server - FAQ

2006

2 EE K. O. Kim: Relating integrated circuit yield and time-dependent reliability for various defect density distributions. IEEE Transactions on Reliability 55(2): 307-313 (2006)

2005

1 EE K. O. Kim, W. Kuo: Some considerations on system burn-in. IEEE Transactions on Reliability 54(2): 207-214 (2005)

2006
2	EE	K. O. Kim: Relating integrated circuit yield and time-dependent reliability for various defect density distributions. IEEE Transactions on Reliability 55(2): 307-313 (2006)
2005
1	EE	K. O. Kim, W. Kuo: Some considerations on system burn-in. IEEE Transactions on Reliability 54(2): 207-214 (2005)

Coauthor Index