2008 | ||
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4 | EE | Ji Hwan Cha, Hisashi Yamamoto, Won Young Yun: Optimal Burn-in for Minimizing Total Warranty Cost. IEICE Transactions 91-A(2): 633-641 (2008) |
2006 | ||
3 | EE | Ji Hwan Cha: An extended model for optimal burn-in procedures. IEEE Transactions on Reliability 55(2): 189-198 (2006) |
2 | EE | Ji Hwan Cha, Hisashi Yamamoto, Won Young Yun: Optimal Workload for a Multi-Tasking k-out-of-n: G Load Sharing System. IEICE Transactions 89-A(1): 288-296 (2006) |
2005 | ||
1 | EE | Ji Hwan Cha: On optimal burn-in procedures - a generalized model. IEEE Transactions on Reliability 54(2): 198-206 (2005) |
1 | Hisashi Yamamoto | [2] [4] |
2 | Won Young Yun | [2] [4] |