Chen-Mao Liao
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2006
1
EE
Chen-Mao Liao,
Sheng-Tsaing Tseng
: Optimal design for step-stress accelerated degradation tests.
IEEE Transactions on Reliability 55
(1): 59-66 (2006)
Coauthor
Index
1
Sheng-Tsaing Tseng
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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