2006 | ||
---|---|---|
3 | EE | Chengjie Xiong, Kejun Zhu, Ming Ji: Analysis of a simple step-stress life test with a random stress-change time. IEEE Transactions on Reliability 55(1): 67-74 (2006) |
2005 | ||
2 | EE | Bangqi Liu, Dechang Chen, Chengjie Xiong, Kai Xing: New methods for binary multiplication. Int. J. Comput. Math. 82(1): 13-22 (2005) |
2004 | ||
1 | EE | Chengjie Xiong, Ming Ji: Analysis of grouped and censored data from step-stress life test. IEEE Transactions on Reliability 53(1): 22-28 (2004) |
1 | Dechang Chen | [2] |
2 | Ming Ji | [1] [3] |
3 | Bangqi Liu | [2] |
4 | Kai Xing | [2] |
5 | Kejun Zhu | [3] |