| |
| 1997 | ||
|---|---|---|
| 1 | EE | Toshinobu Ono, Kazuo Wakui, Hitoshi Hikima, Yoshiyuki Nakamura, Masaaki Yoshida: Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. Asian Test Symposium 1997: 122-125 |
| 1 | Yoshiyuki Nakamura | [1] |
| 2 | Toshinobu Ono | [1] |
| 3 | Kazuo Wakui | [1] |
| 4 | Masaaki Yoshida | [1] |