| |
| 1997 | ||
|---|---|---|
| 1 | Toshiharu Asaka, Masaaki Yoshida, Subhrajit Bhattacharya, Sujit Dey: H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs. ITC 1997: 265-274 | |
| 1 | Subhrajit Bhattacharya | [1] |
| 2 | Sujit Dey | [1] |
| 3 | Masaaki Yoshida | [1] |