Kyoji Yamashita

2005
4	EE	Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005)
3	EE	Dondee Navarro, Takeshi Mizoguchi, Masami Suetake, Kazuya Hisamitsu, Hiroaki Ueno, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential. IEICE Transactions 88-C(5): 1079-1086 (2005)
2	EE	Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma: A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Transactions 88-C(5): 811-816 (2005)
2001
1	EE	D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Michiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: Correlation method of circuit-performance and technology fluctuations for improved design reliability. ASP-DAC 2001: 39-44

Coauthor Index

1	Kazuya Hisamitsu	[3]
2	Satoshi Hosokawa	[4]
3	Hideyuki Iwata	[2]
4	Toshihiko Kitamura	[4]
5	Norio Koike	[2]
6	Shigetaka Kumashiro	[1] [3] [4]
7	Toshihiro Matsuda	[2]
8	Shizunori Matsumoto	[1] [4]
9	Hans Jürgen Mattausch	[1] [3] [4]
10	Michiko Miura-Mattausch	[1]
11	Mitiko Miura-Mattausch	[3] [4]
12	D. Miyawaki	[1]
13	Takeshi Mizoguchi	[3]
14	Akira Muramatsu	[2]
15	Noriaki Nakayama	[1] [3] [4]
16	Dondee Navarro	[3]
17	Tatsuya Ohguro	[4]
18	Takashi Ohzone	[2]
19	S. Ooshiro	[1]
20	Masami Suetake	[1] [3]
21	Hiroaki Takeuchi	[2]
22	Ken-ichiro Tatsuuma	[2]
23	Hiroaki Ueno	[3] [4]
24	Tetsuya Yamaguchi	[1] [3] [4]

Colors in the list of coauthors