Norio Koike

2005
3	EE	Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma: A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Transactions 88-C(5): 811-816 (2005)
2000
2	EE	Yoshiyuki Kawakami, Jingkun Fang, Hirokazu Yonezawa, Nobufusa Iwanishi, Lifeng Wu, Alvin I-Hsien Chen, Norio Koike, Ping Chen, Chune-Sin Yeh, Zhihong Liu: Gate-level aged timing simulation methodology for hot-carrier reliability assurance. ASP-DAC 2000: 289-294
1	EE	Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami: GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. ISQED 2000: 73-80

Coauthor Index

1	Alvin I-Hsien Chen	[1] [2]
2	Ping Chen	[1] [2]
3	Jingkun Fang	[1] [2]
4	Nobufusa Iwanishi	[1] [2]
5	Hideyuki Iwata	[3]
6	Yoshiyuki Kawakami	[1] [2]
7	Zhihong Liu	[1] [2]
8	Toshihiro Matsuda	[3]
9	Akira Muramatsu	[3]
10	Takashi Ohzone	[3]
11	Yoshifumi Okamoto	[1]
12	Hiroaki Takeuchi	[3]
13	Ken-ichiro Tatsuuma	[3]
14	Lifeng Wu	[1] [2]
15	Kyoji Yamashita	[3]
16	Heting Yan	[1]
17	Chune-Sin Yeh	[1] [2]
18	Hirokazu Yonezawa	[1] [2]

Colors in the list of coauthors