2005 | ||
---|---|---|
2 | EE | Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005) |
2001 | ||
1 | EE | D. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Michiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: Correlation method of circuit-performance and technology fluctuations for improved design reliability. ASP-DAC 2001: 39-44 |
1 | Satoshi Hosokawa | [2] |
2 | Toshihiko Kitamura | [2] |
3 | Shigetaka Kumashiro | [1] [2] |
4 | Hans Jürgen Mattausch | [1] [2] |
5 | Michiko Miura-Mattausch | [1] |
6 | Mitiko Miura-Mattausch | [2] |
7 | D. Miyawaki | [1] |
8 | Noriaki Nakayama | [1] [2] |
9 | Tatsuya Ohguro | [2] |
10 | S. Ooshiro | [1] |
11 | Masami Suetake | [1] |
12 | Hiroaki Ueno | [2] |
13 | Tetsuya Yamaguchi | [1] [2] |
14 | Kyoji Yamashita | [1] [2] |