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Shizunori Matsumoto

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2005
2EEShizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005)
2001
1EED. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Michiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: Correlation method of circuit-performance and technology fluctuations for improved design reliability. ASP-DAC 2001: 39-44

Coauthor Index

1Satoshi Hosokawa [2]
2Toshihiko Kitamura [2]
3Shigetaka Kumashiro [1] [2]
4Hans Jürgen Mattausch [1] [2]
5Michiko Miura-Mattausch [1]
6Mitiko Miura-Mattausch [2]
7D. Miyawaki [1]
8Noriaki Nakayama [1] [2]
9Tatsuya Ohguro [2]
10S. Ooshiro [1]
11Masami Suetake [1]
12Hiroaki Ueno [2]
13Tetsuya Yamaguchi [1] [2]
14Kyoji Yamashita [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)