| 2005 |
|---|
| 2 | EE | Dondee Navarro,
Takeshi Mizoguchi,
Masami Suetake,
Kazuya Hisamitsu,
Hiroaki Ueno,
Mitiko Miura-Mattausch,
Hans Jürgen Mattausch,
Shigetaka Kumashiro,
Tetsuya Yamaguchi,
Kyoji Yamashita,
Noriaki Nakayama:
A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential.
IEICE Transactions 88-C(5): 1079-1086 (2005) |
| 2001 |
|---|
| 1 | EE | D. Miyawaki,
Shizunori Matsumoto,
Hans Jürgen Mattausch,
S. Ooshiro,
Masami Suetake,
Michiko Miura-Mattausch,
Shigetaka Kumashiro,
Tetsuya Yamaguchi,
Kyoji Yamashita,
Noriaki Nakayama:
Correlation method of circuit-performance and technology fluctuations for improved design reliability.
ASP-DAC 2001: 39-44 |
