2007 |
5 | EE | Takashi Ohzone,
Eiji Ishii,
Takayuki Morishita,
Kiyotaka Komoku,
Toshihiro Matsuda,
Hideyuki Iwata:
A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width.
IEICE Transactions 90-C(2): 515-522 (2007) |
4 | EE | Takashi Ohzone,
Tatsuaki Sadamoto,
Takayuki Morishita,
Kiyotaka Komoku,
Toshihiro Matsuda,
Hideyuki Iwata:
A CMOS Temperature Sensor Circuit.
IEICE Transactions 90-C(4): 895-902 (2007) |
2006 |
3 | EE | Takashi Ohzone,
Kazuhiko Okada,
Takayuki Morishita,
Kiyotaka Komoku,
Toshihiro Matsuda,
Hideyuki Iwata:
A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET.
IEICE Transactions 89-C(9): 1351-1357 (2006) |
2005 |
2 | EE | Toshihiro Matsuda,
Ryuichi Minami,
Akira Kanamori,
Hideyuki Iwata,
Takashi Ohzone,
Shinya Yamamoto,
Takashi Ihara,
Shigeki Nakajima:
A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit.
IEICE Transactions 88-C(5): 1087-1093 (2005) |
1 | EE | Toshihiro Matsuda,
Hiroaki Takeuchi,
Akira Muramatsu,
Hideyuki Iwata,
Takashi Ohzone,
Kyoji Yamashita,
Norio Koike,
Ken-ichiro Tatsuuma:
A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission.
IEICE Transactions 88-C(5): 811-816 (2005) |