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Takashi Ohzone

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2007
5EETakashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width. IEICE Transactions 90-C(2): 515-522 (2007)
4EETakashi Ohzone, Tatsuaki Sadamoto, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A CMOS Temperature Sensor Circuit. IEICE Transactions 90-C(4): 895-902 (2007)
2006
3EETakashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Transactions 89-C(9): 1351-1357 (2006)
2005
2EEToshihiro Matsuda, Ryuichi Minami, Akira Kanamori, Hideyuki Iwata, Takashi Ohzone, Shinya Yamamoto, Takashi Ihara, Shigeki Nakajima: A Temperature and Supply Voltage Independent CMOS Voltage Reference Circuit. IEICE Transactions 88-C(5): 1087-1093 (2005)
1EEToshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma: A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Transactions 88-C(5): 811-816 (2005)

Coauthor Index

1Takashi Ihara [2]
2Eiji Ishii [5]
3Hideyuki Iwata [1] [2] [3] [4] [5]
4Akira Kanamori [2]
5Norio Koike [1]
6Kiyotaka Komoku [3] [4] [5]
7Toshihiro Matsuda [1] [2] [3] [4] [5]
8Ryuichi Minami [2]
9Takayuki Morishita [3] [4] [5]
10Akira Muramatsu [1]
11Shigeki Nakajima [2]
12Kazuhiko Okada [3]
13Tatsuaki Sadamoto [4]
14Hiroaki Takeuchi [1]
15Ken-ichiro Tatsuuma [1]
16Shinya Yamamoto [2]
17Kyoji Yamashita [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)