| |
| 2005 | ||
|---|---|---|
| 1 | EE | Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005) |
| 1 | Satoshi Hosokawa | [1] |
| 2 | Shigetaka Kumashiro | [1] |
| 3 | Shizunori Matsumoto | [1] |
| 4 | Hans Jürgen Mattausch | [1] |
| 5 | Mitiko Miura-Mattausch | [1] |
| 6 | Noriaki Nakayama | [1] |
| 7 | Tatsuya Ohguro | [1] |
| 8 | Hiroaki Ueno | [1] |
| 9 | Tetsuya Yamaguchi | [1] |
| 10 | Kyoji Yamashita | [1] |