| |
| 2005 | ||
|---|---|---|
| 1 | EE | Toshihiro Matsuda, Hiroaki Takeuchi, Akira Muramatsu, Hideyuki Iwata, Takashi Ohzone, Kyoji Yamashita, Norio Koike, Ken-ichiro Tatsuuma: A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. IEICE Transactions 88-C(5): 811-816 (2005) |
| 1 | Hideyuki Iwata | [1] |
| 2 | Norio Koike | [1] |
| 3 | Toshihiro Matsuda | [1] |
| 4 | Akira Muramatsu | [1] |
| 5 | Takashi Ohzone | [1] |
| 6 | Ken-ichiro Tatsuuma | [1] |
| 7 | Kyoji Yamashita | [1] |