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Hiroaki Ueno

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2005
2EEShizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005)
1EEDondee Navarro, Takeshi Mizoguchi, Masami Suetake, Kazuya Hisamitsu, Hiroaki Ueno, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential. IEICE Transactions 88-C(5): 1079-1086 (2005)

Coauthor Index

1Kazuya Hisamitsu [1]
2Satoshi Hosokawa [2]
3Toshihiko Kitamura [2]
4Shigetaka Kumashiro [1] [2]
5Shizunori Matsumoto [2]
6Hans Jürgen Mattausch [1] [2]
7Mitiko Miura-Mattausch [1] [2]
8Takeshi Mizoguchi [1]
9Noriaki Nakayama [1] [2]
10Dondee Navarro [1]
11Tatsuya Ohguro [2]
12Masami Suetake [1]
13Tetsuya Yamaguchi [1] [2]
14Kyoji Yamashita [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)