2005 | ||
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2 | EE | Shizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005) |
1 | EE | Dondee Navarro, Takeshi Mizoguchi, Masami Suetake, Kazuya Hisamitsu, Hiroaki Ueno, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential. IEICE Transactions 88-C(5): 1079-1086 (2005) |
1 | Kazuya Hisamitsu | [1] |
2 | Satoshi Hosokawa | [2] |
3 | Toshihiko Kitamura | [2] |
4 | Shigetaka Kumashiro | [1] [2] |
5 | Shizunori Matsumoto | [2] |
6 | Hans Jürgen Mattausch | [1] [2] |
7 | Mitiko Miura-Mattausch | [1] [2] |
8 | Takeshi Mizoguchi | [1] |
9 | Noriaki Nakayama | [1] [2] |
10 | Dondee Navarro | [1] |
11 | Tatsuya Ohguro | [2] |
12 | Masami Suetake | [1] |
13 | Tetsuya Yamaguchi | [1] [2] |
14 | Kyoji Yamashita | [1] [2] |