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Satoshi Hosokawa

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2005
1EEShizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005)

Coauthor Index

1Toshihiko Kitamura [1]
2Shigetaka Kumashiro [1]
3Shizunori Matsumoto [1]
4Hans Jürgen Mattausch [1]
5Mitiko Miura-Mattausch [1]
6Noriaki Nakayama [1]
7Tatsuya Ohguro [1]
8Hiroaki Ueno [1]
9Tetsuya Yamaguchi [1]
10Kyoji Yamashita [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)