2008 |
12 | EE | Shiho Hagiwara,
Takumi Uezono,
Takashi Sato,
Kazuya Masu:
Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network.
IEICE Transactions 91-A(4): 951-956 (2008) |
2007 |
11 | EE | Shiho Hagiwara,
Takumi Uezono,
Takashi Sato,
Kazuya Masu:
Improvement of power distribution network using correlation-based regression analysis.
ACM Great Lakes Symposium on VLSI 2007: 513-516 |
10 | EE | Takashi Sato,
Takumi Uezono,
Shiho Hagiwara,
Kenichi Okada,
Shuhei Amakawa,
Noriaki Nakayama,
Kazuya Masu:
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation.
ISQED 2007: 21-26 |
9 | EE | Takashi Sato,
Shiho Hagiwara,
Takumi Uezono,
Kazuya Masu:
Weakness Identification for Effective Repair of Power Distribution Network.
PATMOS 2007: 222-231 |
8 | EE | Shuhei Amakawa,
Takumi Uezono,
Takashi Sato,
Kenichi Okada,
Kazuya Masu:
Adaptable wire-length distribution with tunable occupation probability.
SLIP 2007: 1-8 |
2006 |
7 | EE | Takumi Uezono,
Kenichi Okada,
Kazuya Masu:
Via Distribution Model for Yield Estimation.
ISQED 2006: 479-484 |
6 | EE | Kenichi Okada,
Takumi Uezono,
Kazuya Masu:
Estimation of Power Reduction by On-Chip Transmission Line for 45nm Technology.
PATMOS 2006: 181-190 |
5 | EE | Takumi Uezono,
Kenichi Okada,
Kazuya Masu:
Statistical Modeling of a Via Distribution for Yield Estimation.
IEICE Transactions 89-A(12): 3579-3584 (2006) |
2005 |
4 | EE | Junpei Inoue,
Hiroyuki Ito,
Shinichiro Gomi,
Takanori Kyogoku,
Takumi Uezono,
Kenichi Okada,
Kazuya Masu:
Evaluation of on-chip transmission line interconnect using wire length distribution.
ASP-DAC 2005: 133-138 |
3 | EE | Takanori Kyogoku,
Junpei Inoue,
Hidenari Nakashima,
Takumi Uezono,
Kenichi Okada,
Kazuya Masu:
Wire Length Distribution Model Considering Core Utilization for System on Chip.
ISVLSI 2005: 276-277 |
2 | EE | Takumi Uezono,
Junpei Inoue,
Takanori Kyogoku,
Kenichi Okada,
Kazuya Masu:
Prediction of delay time for future LSI using on-chip transmission line interconnects.
SLIP 2005: 7-12 |
1 | EE | Takanori Kyogoku,
Junpei Inoue,
Hidenari Nakashima,
Takumi Uezono,
Kenichi Okada,
Kazuya Masu:
Wire Length Distribution Model for System LSI.
IEICE Transactions 88-A(12): 3445-3452 (2005) |