| |
| 2007 | ||
|---|---|---|
| 2 | EE | Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu: A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. ISQED 2007: 21-26 |
| 1 | EE | Shuhei Amakawa, Takumi Uezono, Takashi Sato, Kenichi Okada, Kazuya Masu: Adaptable wire-length distribution with tunable occupation probability. SLIP 2007: 1-8 |
| 1 | Shiho Hagiwara | [2] |
| 2 | Kazuya Masu | [1] [2] |
| 3 | Noriaki Nakayama | [2] |
| 4 | Kenichi Okada | [1] [2] |
| 5 | Takashi Sato | [1] [2] |
| 6 | Takumi Uezono | [1] [2] |