| 2003 |
|---|
| 5 | EE | W. Kanert,
H. Dettmer,
B. Plikat,
N. Seliger:
Reliability aspects of semiconductor devices in high temperature applications.
Microelectronics Reliability 43(9-11): 1839-1846 (2003) |
| 4 | EE | G. Coquery,
G. Lefranc,
T. Licht,
R. Lallemand,
N. Seliger,
H. Berg:
High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC.
Microelectronics Reliability 43(9-11): 1871-1876 (2003) |
| 3 | EE | Alberto Castellazzi,
V. Kartal,
R. Kraus,
N. Seliger,
Martin Honsberg-Riedl,
Doris Schmitt-Landsiedel:
Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's.
Microelectronics Reliability 43(9-11): 1877-1882 (2003) |
| 2002 |
|---|
| 2 | EE | N. Seliger,
E. Wolfgang,
G. Lefranc,
H. Berg,
T. Licht:
Reliable power electronics for automotive applications.
Microelectronics Reliability 42(9-11): 1597-1604 (2002) |
| 1 | EE | Alberto Castellazzi,
R. Kraus,
N. Seliger,
Doris Schmitt-Landsiedel:
Reliability analysis of power MOSFET's with the help of compact models and circuit simulation.
Microelectronics Reliability 42(9-11): 1605-1610 (2002) |
